Advances in X-Ray Analysis

Name: Advances in X-Ray Analysis
Brand: Springer-Verlag New York Inc.
SKU: 9781461362937
Price: 52.64 EUR
Availability: InStock

Volume 36

Автор: John V. Gilfrich, Ting C. Huang, C. R. Hubbard, M. R. James, Ron Jenkins, G. R. Lachance, Deane K. Smith

Език:

Корици: С меки корици

Издател: Springer-Verlag New York Inc.

Наличност: Външен склад

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The 41st Annual Conference on Applications of X-Ray Analysis was held August 3-7, 1992, at the Shera...

Информация за книгата

Автор

John V. Gilfrich, Ting C. Huang, C. R. Hubbard, M. R. James, Ron Jenkins, G. R. Lachance, Deane K. Smith

Език

Английски език

Корици

Книга - С меки корици

Издадена

2012

страници

685

EAN

9781461362937

ISBN

9781461362937

Enbook ID

06615195

Издател

Springer-Verlag New York Inc.

Теглоt

1333

Размери

178 x 254 x 38

Пълно описание

The 41st Annual Conference on Applications of X-Ray Analysis was held August 3-7, 1992, at the Sheraton Colorado Springs Hotel, Colorado Springs, Colorado. The Conference is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for further developments. In recent years, one of the most exciting and important developments in the x-ray field has been the applications of grazing-incidence x-rays for surface and thin-film analysis. To introduce the conference attendees to these "leading-edge" developments, the topic for the Plenary Session was "Grazing-Incidence X Ray Characterization of Materials. " The Conference had the privilege of inviting leading experts in the field of x-ray thin film analysis to deliver lectures at the Plenary Session. Dr. D. K. Bowen, University of Warwick, U. K. , opened the session with a lecture on "Grazing Incidence X-Ray Scattering from Thin Films. " He reviewed and compared grazing incidence diffraction, fluorescence and reflectivity techniques. Results of experimental and theoretical analysis were also discussed. Dr. B. Lenge1er, Forchungszentrum Ju1ich, Germany, followed with a lecture on "Grazing Incidence Diffuse X-Ray Scattering from Thin Films. " He concentrated on the use of newly developed "off-specular" reflectivity techniques for the determination of vertical roughness, lateral correlation length and contour exponent on surfaces.

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Advances in X-Ray Analysis

Volume 36

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