Applied Scanning Probe Methods III

Name: Applied Scanning Probe Methods III
Brand: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
SKU: 9783642065965
Price: 113.22 EUR
Availability: InStock

Characterization

Автор: Bharat Bhushan, Harald Fuchs

Език:

Корици: С меки корици

Издател: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Наличност: Външен склад

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113.22 € 221.44 лв

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied...

Информация за книгата

Автор

Bharat Bhushan, Harald Fuchs

Език

Английски език

Корици

Книга - С меки корици

Издадена

2010

страници

378

EAN

9783642065965

ISBN

3642065961

Enbook ID

01651829

Издател

Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Теглоt

646

Размери

155 x 235 x 21

Пълно описание

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

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Applied Scanning Probe Methods III

Characterization

Информация за книгата

Пълно описание

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