Книга Automating Software Defect Detection Through Machine Learning and LLMs Pancham Singh

Automating Software Defect Detection Through Machine Learning and LLMs

Език: Английски език
Корици: С меки корици
Издател: IGI Global
Наличност: Външен склад
Изпращаме след 10-18 дни
211.28 413.23 лв
As software systems grow in complexity and scale, ensuring their reliability and quality becomes cha...

Информация за книгата

Език
Английски език
Корици
Книга - С меки корици
Издадена
2025
страници
428
EAN
9798337344614
Enbook ID
49880468
Издател
Теглоt
800
Размери
178 x 254 x 23

Пълно описание

As software systems grow in complexity and scale, ensuring their reliability and quality becomes challenging. Traditional methods of defect detection are time-consuming, prone to errors, and inadequate for identifying issues. To address these limitations, the integration of machine learning (ML) techniques and large language models (LLMs) emerges as a transformative approach in automating software defect detection. ML algorithms can learn from historical bug data to predict vulnerabilities, while LLMs can detect anomalies with high accuracy. This convergence holds the potential to improve automation, software engineering, and defect detection, while introducing new challenges in interpretability, data bias, and model reliability that require further exploration. Automating Software Defect Detection Through Machine Learning and LLMs explores how cutting-edge technologies like machine learning (ML) and large language models (LLMs) transform software detection. It examines how these technologies enhance accuracy, scalability, and efficiency in identifying and mitigating software defects. This book covers topics such as algorithms, fraud detection, and software engineering, and is a useful resource for engineers, security professionals, academicians, researchers, and computer scientists.

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