Книга Defect Detection via THz Imaging Kaveh Houshmand

Defect Detection via THz Imaging

Potentials and Limitations

Автор: Kaveh Houshmand
Език: Английски език
Корици: С меки корици
Издател: VDM Verlag
Наличност: Външен склад
Изпращаме след 9-15 дни
49.77 97.34 лв
Until recent years, terahertz waves were an§undiscovered, or most importantly, an unexploited§area o...

Информация за книгата

Автор
Език
Английски език
Корици
Книга - С меки корици
Издадена
2008
страници
88
EAN
9783639103694
ISBN
3639103696
Enbook ID
06819352
Издател
Теглоt
127
Размери
152 x 229 x 5

Пълно описание

Until recent years, terahertz waves were an§undiscovered, or most importantly, an unexploited§area of electromagnetic spectrum. Recent advances in§hardware have started to open up the eld to new§applications such as THz imaging. This non§destructive technology can penetrate through diverse§material such that the internal structure which is§invisible to other imaging modalities, can be§visualized. However, automated processing of THz§images can be quite challenging. Low contrast and the§presence of a widely unknown type of noise make the§analysis of these images difficult. Therefore,§pre-processing techniques are required for further§investigations.

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