Delay Fault Testing for VLSI Circuits

Name: Delay Fault Testing for VLSI Circuits
Brand: Springer
SKU: 9780792382959
Price: 157.54 EUR
Availability: InStock

Автор: Angela Krstic, Kwang-Ting (Tim) Cheng

Език:

Корици: С твърди корици

Издател: Springer

Наличност: Външен склад

Изпращаме след 10-13 дни

157.54 € 308.11 лв

With the ever-increasing speed of integrated circuits, violations of the performance specifications...

Информация за книгата

Автор

Angela Krstic, Kwang-Ting (Tim) Cheng

Език

Английски език

Корици

Книга - С твърди корици

Издадена

1998

страници

191

EAN

9780792382959

ISBN

0792382951

Enbook ID

01397538

Издател

Springer

Теглоt

1050

Размери

155 x 235 x 17

Пълно описание

With the ever-increasing speed of integrated circuits, violations of the performance specifications are becoming a major factor affecting the product quality level. The need for testing timing defects is further expected to grow with the current design trend of moving towards deep submicron devices. After a long period of prevailing belief that high stuck-at fault coverage is sufficient to guarantee high quality of shipped products, the industry is now forced to rethink other types of testing. §Delay testing has been a topic of extensive research both in industry and in academia for more than a decade. As a result, several delay fault models and numerous testing methodologies have been proposed. Delay Fault Testing for VLSI Circuits presents a selection of existing delay testing research results. It combines introductory material with state-of-the-art techniques that address some of the current problems in delay testing. Delay Fault Testing for VLSI Circuits covers some basic topics such as fault modeling and test application schemes for detecting delay defects. It also presents summaries and conclusions of several recent case studies and experiments related to delay testing. A selection of delay testing issues and test techniques such as delay fault simulation, test generation, design for testability and synthesis for testability are also covered. §Delay Fault Testing for VLSI Circuits is intended for use by CAD and test engineers, researchers, tool developers and graduate students. It requires a basic background in digital testing. The book can used as supplementary material for a graduate-level course on VLSI testing.

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Delay Fault Testing for VLSI Circuits

Информация за книгата

Пълно описание

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