Electromigration Inside Logic Cells

Name: Electromigration Inside Logic Cells
Brand: Springer International Publishing AG
SKU: 9783319840413
Price: 59.37 EUR
Availability: InStock

Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS

Автор: GRACIELI POSSER

Език:

Корици: С меки корици

Издател: Springer International Publishing AG

Наличност: Външен склад в ограничено количество

Изпращаме след 13-18 дни

59.37 € 116.12 лв

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-inte...

Информация за книгата

Автор

GRACIELI POSSER

Език

Английски език

Корици

Книга - С меки корици

Издадена

2018

страници

118

EAN

9783319840413

ISBN

9783319840413

Enbook ID

19821903

Издател

Springer International Publishing AG

Теглоt

454

Размери

155 x 235 x 5

Пълно описание

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics.

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Electromigration Inside Logic Cells

Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS

Информация за книгата

Пълно описание

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