Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Name: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Brand: Cambridge University Press
SKU: 9780521848756
Price: 113.57 EUR
Availability: InStock

Автор: S J B Reed

Език:

Корици: С твърди корици

Издател: Cambridge University Press

Наличност: Външен склад

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113.57 € 222.13 лв

Originally published in 2005, this book covers the closely related techniques of electron microprobe...

Информация за книгата

Автор

S J B Reed

Език

Английски език

Корици

Книга - С твърди корици

Издадена

2005

страници

232

EAN

9780521848756

ISBN

052184875X

Enbook ID

04095600

Издател

Cambridge University Press

Теглоt

584

Размери

182 x 255 x 15

Пълно описание

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

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Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

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