Failure Mechanisms in Semiconductor Devices 2e

Автор: E. Ajith Amerasekera, Farid N. Najm

Език:

Корици: С твърди корици

Издател: John Wiley & Sons Inc

Наличност: Външен склад

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Failure Mechanisms in Semiconductor Devices Second Edition E. Ajith Amerasekera Texas Instruments In...

Информация за книгата

Автор

E. Ajith Amerasekera, Farid N. Najm

Език

Английски език

Корици

Книга - С твърди корици

Издадена

1997

страници

358

EAN

9780471954828

ISBN

0471954829

Enbook ID

04894821

Издател

John Wiley & Sons Inc

Теглоt

674

Размери

166 x 235 x 27

Пълно описание

Failure Mechanisms in Semiconductor Devices Second Edition E. Ajith Amerasekera Texas Instruments Inc., Dallas, USA Farid N. Najm University of Illinois at Urbana-Champaign, USA Since the successful first edition of Failure Mechanisms in Semiconductor Devices, semiconductor technology has become increasingly important. The high complexity of today's integrated circuits has engendered a demand for greater component reliability. Reflecting the need for guaranteed performance in consumer applications, this thoroughly updated edition includes more detailed material on reliability modelling and prediction. The book analyses the main failure mechanisms in terms of cause, effects and prevention and explains the mathematics behind reliability analysis. The authors detail methodologies for the identification of failures and describe the approaches for building reliability into semiconductor devices. Their thorough yet accessible text covers the physics of failure mechanisms from the semiconductor die itself to the packaging and interconnections. Incorporating recent advances, this comprehensive survey of semiconductor reliability will be an asset to both engineers and graduate students in the field.

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Failure Mechanisms in Semiconductor Devices 2e

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