Книга High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip Zheng Wang

High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip

Език: Английски език
Корици: С меки корици
Издател: Springer Verlag, Singapore
Наличност: Външен склад
Изпращаме след 5-8 дни
105.30 205.95 лв
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technolo...

Информация за книгата

Език
Английски език
Корици
Книга - С меки корици
Издадена
2018
страници
197
EAN
9789811093210
Enbook ID
20095107
Теглоt
3401
Размери
155 x 235 x 13

Пълно описание

This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.

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