Integrated Circuit Failure Analysis - A Guide to Preparation Techniques

Name: Integrated Circuit Failure Analysis - A Guide to Preparation Techniques
Brand: John Wiley & Sons Inc
SKU: 9780471974017
Price: 226.99 EUR
Availability: InStock

Автор: Friedrich Beck

Език:

Корици: С твърди корици

Издател: John Wiley & Sons Inc

Наличност: Външен склад

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226.99 € 443.96 лв

Fault analysis of highly-integrated semiconductor circuits has become an indispensable discipline in...

Информация за книгата

Автор

Friedrich Beck

Език

Английски език

Корици

Книга - С твърди корици

Издадена

1998

страници

190

EAN

9780471974017

ISBN

0471974013

Enbook ID

04895159

Издател

John Wiley & Sons Inc

Теглоt

396

Размери

162 x 239 x 16

Пълно описание

Fault analysis of highly-integrated semiconductor circuits has become an indispensable discipline in the optimization of product quality. Integrated Circuit Failure Analysis describes state-of-the-art procedures for exposing suspected failure sites in semiconductor devices. The author adopts a hands-on problem-oriented approach, founded on many years of practical experience, complemented by the explanation of basic theoretical principles. Features include: Advanced methods in device preparation and technical procedures for package inspection and semiconductor reliability. Illustration of chip isolation and step-by-step delayering of chips by wet chemical and modern plasma dry etching techniques. Particular analysis of bipolar and MOS circuits, although techniques are equally relevant to other semiconductors. Advice on the choice of suitable laboratory equipment. Numerous photographs and drawings providing guidance for checking results. Focusing on modern techniques, this practical text will enable both academic and industrial researchers and IC designers to expand the range of analytical and preparative methods at their disposal and to adapt to the needs of new technologies.

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Integrated Circuit Failure Analysis - A Guide to Preparation Techniques

Информация за книгата

Пълно описание

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