Kelvin Probe Force Microscopy
From Single Charge Detection to Device Characterization
Автор:
Thilo Glatzel, Sascha Sadewasser
Наличност:
Външен склад
Изпращаме след 10-18 дни
215.01
€
420.52 лв
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force mic...
