Localization in Thin Films

Name: Localization in Thin Films
Brand: VDM Verlag Dr. Müller
SKU: 9783639180091
Price: 50.87 EUR
Availability: InStock

Theory and Numerical Studies

Автор: R. K. Brojen Singh

Език:

Корици: С меки корици

Издател: VDM Verlag Dr. Müller

Наличност: Налично при издателя, по поръчка

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The study of the behavior of electronic states in thin films is quite interesting from the following...

Информация за книгата

Автор

R. K. Brojen Singh

Език

Английски език

Корици

Книга - С меки корици

Издадена

2009

страници

104

EAN

9783639180091

Enbook ID

06826237

Издател

VDM Verlag Dr. Müller

Теглоt

171

Размери

150 x 220 x 6

Пълно описание

The study of the behavior of electronic states in thin films is quite interesting from the following point of view, that one can study and understand the remarkable scaling theory predictions in the cross over from two to three dimensions and to look at whether physical picture of interference due to scattering of Bloch states from the impurities is adequate in the more general situation. The role of film thickness in metal insulator transition (MIT) is investigated numerically using finite size scaling and transfer matrix methods. Self-consistent theory is being used to treat this problem and extended the theory to thin films. We also examine the criteria of the phase transition in the presence of magnetic field (B) by investigating critical behavior of localization length and conductivity around MIT line in (B, localization length) plane. Furthermore, we also investigated MIT induced by various other parameters such as inelastic coherence length, temperature, magnetic field and film thickness.

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Localization in Thin Films

Theory and Numerical Studies

Информация за книгата

Пълно описание

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