Книга Materials Reliability Issues in Microelectronics: Volume 225 James R. LloydFrederick G. YostPaul S. Ho

Materials Reliability Issues in Microelectronics: Volume 225

Език: Английски език
Корици: С твърди корици
Издател: Materials Research Society
Наличност: Очаква се допечатка
Срокът не е известен
36.23 70.86 лв
With the increased complexity of modern integrated circuits, it is important that reliability proble...

Информация за книгата

Език
Английски език
Корици
Книга - С твърди корици
Издадена
1991
страници
382
EAN
9781558991194
ISBN
1558991190
Enbook ID
02059930
Теглоt
700
Размери
155 x 235 x 25

Пълно описание

With the increased complexity of modern integrated circuits, it is important that reliability problems be attacked properly with the appropriate tools. This volume recognizes that almost all reliability problems are materials problems, and helps to put 'reliabilty physics' on a firm scientific foundation. Topics include: electromigration; stress effects on reliability; stress and packaging; metallization; device, oxide and dielectric reliability; new investigative techniques; corrosion.

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