Nanometer Technology Designs

Name: Nanometer Technology Designs
Brand: Springer-Verlag New York Inc.
SKU: 9780387764863
Price: 105.43 EUR
Availability: InStock

High-Quality Delay Tests

Автор: Mohammad Tehranipoor, Nisar Ahmed

Език:

Корици: С твърди корици

Издател: Springer-Verlag New York Inc.

Наличност: Външен склад

Изпращаме след 10-13 дни

105.43 € 206.21 лв

Adopting new fabrication technologies not only provides higher integration and enhances performance,...

Информация за книгата

Автор

Mohammad Tehranipoor, Nisar Ahmed

Език

Английски език

Корици

Книга - С твърди корици

Издадена

2007

страници

281

EAN

9780387764863

ISBN

0387764860

Enbook ID

01382894

Издател

Springer-Verlag New York Inc.

Теглоt

626

Размери

164 x 242 x 22

Пълно описание

Adopting new fabrication technologies not only provides higher integration and enhances performance, but also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz timing-related defects havv become a high proportion of the total chip defects. For nanometer technology designs, the stuck-at fault test alone cannot ensure a high quality level of chips. At-speed tests using the transition fault model has become a requirement in technologies below 180nm.§Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise (including IR-drop, ground bounce, and Ldi/dt) effects on chip performance, high test pattern volume, low fault/defect coverage, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.

Може също да ви хареса

Клиенти, които купиха тази книга, купиха също

Най-често търсени

Categories

Authors

Publishers

Продукти

Продукти

Най-често търсени

Categories

Authors

Publishers

Продукти

Продукти

Nanometer Technology Designs

High-Quality Delay Tests

Информация за книгата

Пълно описание

Може също да ви хареса

Клиенти, които купиха тази книга, купиха също