Positron Profilometry

Name: Positron Profilometry
Brand: Springer, Berlin
SKU: 9783031410925
Price: 51.92 EUR
Availability: InStock

Probing Material Depths for Enhanced Understanding

Автор: Jerzy Dryzek

Език:

Корици: С меки корици

Издател: Springer, Berlin

Наличност: Външен склад

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This book provides a comprehensive overview of positron profilometry, specifically focusing on the a...

Информация за книгата

Автор

Jerzy Dryzek

Език

Английски език

Корици

Книга - С меки корици

Издадена

2023

страници

152

EAN

9783031410925

Enbook ID

43748855

Издател

Springer, Berlin

Теглоt

272

Размери

155 x 235

Пълно описание

This book provides a comprehensive overview of positron profilometry, specifically focusing on the analysis of defect depth distribution in materials. Positron profilometry plays a crucial role in understanding and characterizing defects in a wide range of materials, including metals, semiconductors, polymers, and ceramics. By analyzing the depth distribution of defects, researchers can gain insights into various material properties, such as crystal structure, defect density, and diffusion behavior. The author's extensive research spanning a period of two decades has primarily centered on subsurface zones. These regions, located beneath the surface and subjected to various surface processes, play a crucial role in generating defect distributions. Three experimental techniques and their data analysis are described in detail: a variable-energy positron beam (VEP) called sometimes a slow positron beam, a technique called implantation profile depth scanning (DSIP), and a sequential etching (SET) technique. The usability of these techniques is illustrated by many examples of measurements by the author and others.

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Positron Profilometry

Probing Material Depths for Enhanced Understanding

Информация за книгата

Пълно описание

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Клиенти, които купиха тази книга, купиха също