Книга Principles of Electron Optics, Volume 3 Peter Hawkes

Principles of Electron Optics, Volume 3

Fundamental Wave Optics

Автор: Peter Hawkes, Erwin Kasper
Език: Английски език
Корици: С меки корици
Издател: Elsevier Books
Наличност: Външен склад
Изпращаме след 14-21 дни
274.73 537.33 лв
The behaviour of beams of free electrons, released from a source and propagating through a vacuum re...

Информация за книгата

Език
Английски език
Корици
Книга - С меки корици
Издадена
2022
страници
558
EAN
9780128189795
Enbook ID
33475846
Издател
Теглоt
1182
Размери
239 x 195 x 32

Пълно описание

The behaviour of beams of free electrons, released from a source and propagating through a vacuum region in some device, is of interest in many diverse fields of instrumentation and technology. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics, where effects due to wavelength are neglected, and wave optics, where these effects are considered. Volumes 1 and 2 were devoted to geometrical optics. This final volume, Principles of Electron Optic: Volume 3: Wave Optics is concerned with wave optics. A knowledge of this branch of the subject is essential in microscopy, to understand the propagation of electrons from the source to the specimen, through the latter and from it to the image plane of the instrument. It is also needed to explain all interference phenomena, notably holography, and in formal coherence theory.The second edition is revised throughout with new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, and 3D-reconstruction. Includes authoritative coverage of the fundamental theory behind electron beamsDescribes the interaction of electrons with solids and the information that can be obtained from electron-beam techniquesAddresses recent relevant research topics including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement

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