Книга Reliability Technology for Integrated Circuit Packaging Yunfei En

Reliability Technology for Integrated Circuit Packaging

Автор: Yunfei En, Si Chen
Език: Английски език
Корици: С твърди корици
Издател: Springer-Verlag GmbH
Наличност: Външен склад
Изпращаме след 10-13 дни
165.02 322.76 лв
This book consists of ten chapters on IC packaging technologies, covering failure modes, mechanisms,...

Информация за книгата

Автор
Език
Английски език
Корици
Книга - С твърди корици
Издадена
2026
страници
509
EAN
9789819538843
ISBN
981953884X
Enbook ID
49699488
Издател
Теглоt
1010

Пълно описание

This book consists of ten chapters on IC packaging technologies, covering failure modes, mechanisms, advanced structures and reliability methods, with a focus on materials, structure and stress.

Reliability, a key indicator of product quality, spans multiple disciplines such as materials science and electronics. In China's pursuit of "high-quality development" a focus on reliability is essential to advancing manufacturing.

Written by a leading expert from the State Key Laboratory, this book is important for improving the performance of electronic products and supporting the growth of China's electronic information industry.

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