Книга Scanning Probe Microscopy Bert Voigtlander

Scanning Probe Microscopy

Atomic Force Microscopy and Scanning Tunneling Microscopy

Автор: Bert Voigtlander
Език: Английски език
Корици: С меки корици
Наличност: Външен склад
Изпращаме след 10-18 дни
188.73 369.13 лв
This book explains the operating principles of atomic force microscopy and scanning tunneling micros...

Информация за книгата

Автор
Език
Английски език
Корици
Книга - С меки корици
Издадена
2016
страници
382
EAN
9783662505571
ISBN
3662505576
Enbook ID
15201769
Теглоt
6029
Размери
155 x 235 x 22

Пълно описание

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

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