Книга Semiconductor Material and Device Characterization  3e Dieter K. Schroder

Semiconductor Material and Device Characterization 3e

Автор: Dieter K. Schroder
Език: Английски език
Корици: С твърди корици
Издател: John Wiley & Sons Inc
Наличност: Външен склад
Изпращаме след 9-15 дни
246.98 483.05 лв
Semiconductor Material and Device Characterization is the only book on the market devoted to the cha...

Информация за книгата

Автор
Език
Английски език
Корици
Книга - С твърди корици
Издадена
2006
страници
800
EAN
9780471739067
ISBN
0471739065
Enbook ID
01389606
Издател
Теглоt
1324
Размери
243 x 238 x 51

Пълно описание

Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. It covers the full range of electrical and optical characterization methods while thoroughly treating the more specialized chemical and physical techniques. In the third edition, Professor Schroder has rewritten parts of each chapter and added two new chapters (Charge Based Measurements and Failure Analysis and Reliability), redrawn and updated most figures, and included new problems and approximately 100 new references.

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