Semiconductor Memory Testing

Name: Semiconductor Memory Testing
Brand: VDM Verlag Dr. Müller
SKU: 9783639194401
Price: 50.98 EUR
Availability: InStock

Fault Models and Test Considerations for High Performance Embedded SRAM's

Автор: Anuj Gupta

Език:

Корици: С меки корици

Издател: VDM Verlag Dr. Müller

Наличност: Налично при издателя, по поръчка

Изпращаме след 17-27 дни

50.98 € 99.70 лв

Stringent test quality requirements, at-speed test limitations & total cost associated with using ex...

Информация за книгата

Автор

Anuj Gupta

Език

Английски език

Корици

Книга - С меки корици

Издадена

2009

страници

EAN

9783639194401

Enbook ID

06827526

Издател

VDM Verlag Dr. Müller

Теглоt

114

Размери

151 x 4 x 10

Пълно описание

Stringent test quality requirements, at-speed test limitations & total cost associated with using expensive off-chip testers for embedded memory testing have forced system designers to introduce on-chip Memory Built-in Self Test (MBIST) techniques to generate, apply, read and compares test patterns in order to expose subtle defects of SRAM''s. The book discusses in detail the various fault models and test requirements associated with embedded SRAM s in today s System-On-Chip s and focuses on the implementation of testing algorithms for embedded SRAMs in the MBIST engine. The book also discusses a finding where failure analysis and silicon debug required an update to the algorithms and pattern backgrounds implemented in the MBIST.

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