Книга Stress Induced Phenomena in Metallization Shefford P. Baker

Stress Induced Phenomena in Metallization

Sixth International Workshop on Stress Induced Phenomena in Metallization, Ithaca, New York, 25-27 July 2001

Език: Английски език
Корици: С твърди корици
Издател: Springer, Berlin
Наличност: 50% вероятност
Ще претърсим света
132.59 259.33 лв
Tiny metal structures, less than a millionth of a meter across, are critical building blocks in a nu...

Информация за книгата

Език
Английски език
Корици
Книга - С твърди корици
Издадена
2002
страници
250
EAN
9780735400580
Enbook ID
01390770
Издател
Теглоt
590
Размери
155 x 235

Пълно описание

Tiny metal structures, less than a millionth of a meter across, are critical building blocks in a number of high-tech devices such as computer chips. These "metallizations" are subjected to extreme conditions of temperature, electric current density, and mechanical load, which may cause the device they are in to fail. This book contains research papers on these metallizations and on the reliability problems associated with them. The papers were peer reviewed for these proceedings.

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