Книга Surface Roughness Study by Atomic Force Microscopy Md.Abu Sayeed

Surface Roughness Study by Atomic Force Microscopy

Surface Roughness-Practical Example

Език: Английски език
Корици: С меки корици
Наличност: Налично при издателя, по поръчка
Изпращаме след 17-27 дни
51.02 99.79 лв
AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capab...

Информация за книгата

Език
Английски език
Корици
Книга - С меки корици
Издадена
2012
страници
72
EAN
9783848400355
Enbook ID
07085730
Теглоt
118
Размери
152 x 229 x 4

Пълно описание

AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces and studying the topography. It is very suitable for biological system to determine substrate roughness analysis. The chitinous materials that mean microbiological matter are imaged for determining the surface roughness and interaction force of microbial surfaces by AFM.

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