Книга VLSI Design and Test S. Rajaram

VLSI Design and Test

22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers

Език: Английски език
Корици: С меки корици
Издател: Springer Verlag, Singapore
Наличност: Външен склад
Изпращаме след 5-8 дни
105.15 205.65 лв
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design an...

Информация за книгата

Език
Английски език
Корици
Книга - С меки корици
Издадена
2019
страници
722
EAN
9789811359491
Enbook ID
20943800
Теглоt
1116
Размери
155 x 235 x 40

Пълно описание

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

Може също да ви хареса

59.16 115.71 лв

My Son's Story

Nadine Gordimer
16.58 32.42 лв

Who Was Wolfgang Amadeus Mozart

Yona Zeldis McDonough
6.06 11.85 лв

Superstition and Force

Henry Charles Lea
27.45 53.68 лв
230.44 450.71 лв
26.65 52.12 лв

Open Secrets

Robert Winder
4.45 8.71 лв

Клиенти, които купиха тази книга, купиха също