X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

Name: X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
Brand: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
SKU: 9783642057694
Price: 158.03 EUR
Availability: InStock

Автор: Martin Schmidbauer

Език:

Корици: С меки корици

Издател: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Наличност: Външен склад

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This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scatter...

Информация за книгата

Автор

Martin Schmidbauer

Език

Английски език

Корици

Книга - С меки корици

Издадена

2010

страници

204

EAN

9783642057694

ISBN

3642057691

Enbook ID

01651105

Издател

Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Теглоt

338

Размери

156 x 12 x 12

Пълно описание

This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.

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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

Информация за книгата

Пълно описание

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