Transmission Electron Microscopy

Name: Transmission Electron Microscopy
Brand: Springer International Publishing AG
SKU: 9783319266497
Price: 139.86 EUR
Availability: InStock

Diffraction, Imaging, and Spectrometry

Автор: C. Barry Carter, David B. Williams

Език:

Корици: С твърди корици

Издател: Springer International Publishing AG

Наличност: Налично при издателя, по поръчка

Изпращаме след 17-27 дни

139.86 € 273.55 лв

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Scienc...

Информация за книгата

Автор

C. Barry Carter, David B. Williams

Език

Английски език

Корици

Книга - С твърди корици

Издадена

2016

страници

518

EAN

9783319266497

ISBN

3319266497

Enbook ID

09931565

Издател

Springer International Publishing AG

Теглоt

1466

Размери

217 x 288 x 27

Пълно описание

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today's instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging-the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science.§§Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.§§

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Transmission Electron Microscopy

Diffraction, Imaging, and Spectrometry

Информация за книгата

Пълно описание

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