Encyclopedia of Scanning Electron Microscopy

Name: Encyclopedia of Scanning Electron Microscopy
Brand: NY RESEARCH PRESS
SKU: 9781632381668
Price: 117.47 EUR
Availability: InStock

Автор: Lisa Page

Език:

Корици: С твърди корици

Издател: NY RESEARCH PRESS

Наличност: Външен склад

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117.47 € 229.76 лв

This book focuses on various issues concerned with scanning electron microscopy, as well as its theo...

Информация за книгата

Автор

Lisa Page

Език

Английски език

Корици

Книга - С твърди корици

Издадена

2015

страници

324

EAN

9781632381668

ISBN

1632381664

Enbook ID

12434373

Издател

NY RESEARCH PRESS

Теглоt

616

Размери

237 x 162 x 2

Пълно описание

This book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. Numerous topics are covered under two sections "Instrumentation, Methodology" and "Biology, Medicine" for electronic industry. This book includes contributions by renowned researchers and experts in this field.

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Encyclopedia of Scanning Electron Microscopy

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